A. V. Nefiodov

A novel room-temperature ion source for the production of atomic ions in electron beam within wide ranges of electron energy and current density is developed. The device can operate both as conventional Electron Beam Ion Source/Trap (EBIS/T) and novel Main Magnetic Focus Ion Source. The ion source is suitable for generation of the low-, medium- and high-density microplasma in steady state, which can be employed for investigation of a wide range of physical problems in ordinary university laboratory, in particular, for microplasma simulations relevant to astrophysics and ITER reactor. For the electron beam characterized by the incident energy $E_e = 10$ keV, the current density $j_e \sim 20$ kA/cm$^2$ and the number density $n_e \sim 2 \times 10^{13}$ cm$^{-3}$ were achieved experimentally. For $E_e \sim 60$ keV, the value of electron number density $n_e \sim 10^{14}$ cm$^{-3}$ is feasible. The efficiency of the novel ion source for laboratory astrophysics significantly exceeds that of other existing warm and superconducting EBITs. A problem of the K-shell electron ionization of heavy and superheavy elements is also discussed.

In the main magnetic focus ion source, atomic ions are produced in the local ion trap created by the rippled electron beam in focusing magnetic field. Here we present the novel modification of the room-temperature hand-size device, which allows the extraction of ions in the radial direction perpendicular to the electron beam across the magnetic field. The detected X-ray emission evidences the production of Ir$^{44+}$ and Ar$^{16+}$ ions. The ion source can operate as the ion trap for X-ray spectroscopy, as the ion source for the production of highly charged ions and also as the ion source of high brightness.

The basic principles of design for the compact ion source of new generation are presented. The device uses the local ion trap created by the axial electron beam rippled in a thick magnetic lens. In accordance with this feature, the ion source is given the name main magnetic focus ion source. The experimental evidences for the production of Ir$^{59+}$, Xe$^{44+}$, and Ar$^{16+}$ ions are obtained. The control over depth of the local ion trap is shown to be feasible.

It is proposed to produce highly charged ions in the local potential traps formed by the rippled electron beam in a focusing magnetic field. In this method, the extremely high electron current densities can be attained on short length of the ion trap. The design the very compact ion sources is feasible. For such ions as, for example, Ne${}^{8+}$ and Xe${}^{44+}$, the intensities of about $10^9$ and $10^6$ particles per second, respectively, can be obtained.