Chang-Eun Kim

How Correlated Adsorbate Dynamics on Realistic Substrates Can Give Rise to 1/ω Electric-Field Noise in Surface Ion Traps

Benjamin Foulon [1], Keith G. Ray [2], Chang-Eun Kim [2], Yuan Liu [3], Brenda M. Rubenstein [4], Vincenzo Lordi [2]

Abstract

Ion traps are promising architectures for implementing scalable quantum computing, but they suffer from excessive "anomalous" heating that prevents their full potential from being realized. This heating, which is orders of magnitude larger than that expected from Johnson-Nyquist noise, results in ion motion that leads to decoherence and reduced fidelity in quantum logic gates. The exact origin of anomalous heating is an open question, but experiments point to adsorbates on trap electrodes as a likely source. Many different models of anomalous heating have been proposed, but these models have yet to pinpoint the atomistic origin of the experimentally-observed $1/ω$ electric field noise scaling observed in ion traps at frequencies between 0.1-10 MHz. In this work, we perform the first computational study of the ion trap electric field noise produced by the motions of multiple monolayers of adsorbates described by first principles potentials. In so doing, we show that correlated adsorbate motions play a definitive role in producing $1/ω$ noise and identify candidate collective adsorbate motions, including translational and rotational motions of adsorbate patches and multilayer exchanges, that give rise to $1/ω$ scaling at the MHz frequencies typically employed in ion traps. These results demonstrate that multi-adsorbate systems, even simple ones, can give rise to a set of activated motions that can produce the $1/ω$ noise observed in ion traps and that collective, rather than individual, adsorbate motions are much more likely to give rise to low-frequency heating.

Changes in electric-field noise due to thermal transformation of a surface ion trap

Maya Berlin-Udi [1,2], Clemens Matthiesen [1], P. N. Thomas Lloyd [1], Alberto M. Alonso [1,2], Crystal Noel [1], Benjamin Saarel [1,2], Christine A. Orme [3], Chang-Eun Kim [3], Art J. Nelson [3], Keith G. Ray [3], Vincenzo Lordi [3,1,2], Hartmut Häffner

Abstract

We aim to illuminate how the microscopic properties of a metal surface map to its electric-field noise characteristics. In our system, prolonged heat treatments of a metal film can induce a rise in the magnitude of the electric-field noise generated by the surface of that film. We refer to this heat-induced rise in noise magnitude as a thermal transformation. The underlying physics of this thermal transformation process is explored through a series of heating, milling, and electron treatments performed on a single surface ion trap. Between these treatments, $^{40}$Ca$^+$ ions trapped 70~$μ$m above the surface of the metal are used as detectors to monitor the electric-field noise at frequencies close to 1~MHz. An Auger spectrometer is used to track changes in the composition of the contaminated metal surface. With these tools we investigate contaminant deposition, chemical reactions, and atomic restructuring as possible drivers of thermal transformations.