Farid Shahandeh

Quantum Error Correction (QEC) exploits redundancy by encoding logical information into multiple physical qubits. In current implementations of QEC, sequences of non-perfect two-qubit entangling gates are used to codify the information redundantly into multipartite entangled states. Also, to extract the error syndrome, a series of two-qubit gates are used to build parity-check readout circuits. In the case of noisy gates, both steps cannot be performed perfectly, and an error model needs to be provided to assess the performance of QEC. We present a detailed microscopic error model to estimate the average gate infidelity of two-qubit light-shift gates used in trapped-ion platforms. We analytically derive leading-error contributions in terms of microscopic parameters and present effective error models that connect the error rates typically used in phenomenological accounts to the microscopic gate infidelities hereby derived. We then apply this realistic error model to quantify the multipartite entanglement generated by circuits that act as QEC building blocks. We do so by using entanglement witnesses, complementing in this way the recent studies by exploring the effects of a more realistic microscopic noise.

Ensuring the correct functioning of quantum error correction (QEC) circuits is crucial to achieve fault tolerance in realistic quantum processors subjected to noise. The first checkpoint for a fully operational QEC circuit is to create genuine multipartite entanglement across all subsystems of physical qubits. We introduce a conditional witnessing technique to certify genuine multipartite entanglement (GME) that is efficient in the number of subsystems and, importantly, robust against experimental noise and imperfections. Specifically, we prove that the detection of entanglement in a linear number of bipartitions by a number of measurements that also scales linearly, suffices to certify GME. Moreover, our method goes beyond the standard procedure of separating the state from the convex hull of biseparable states, yielding an improved finesse and robustness compared to previous techniques. We apply our method to the noisy readout of stabilizer operators of the distance-three topological color code and its flag-based fault-tolerant version. In particular, we subject the circuits to combinations of three types of noise, namely, uniform depolarizing noise, two-qubit gate depolarizing noise, and bit-flip measurement noise. We numerically compare our method with the standard, yet generally inefficient, fidelity test and to a pair of efficient witnesses, verifying the increased robustness of our method. Last but not least, we provide the full translation of our analysis to a trapped-ion native gate set that makes it suitable for experimental applications.