Robin Harper

Characterizing physical and logical errors in a transversal CNOT via cycle error reconstruction

Nicholas Fazio [1], Robert Freund [2], Debankan Sannamoth [3,4], Alex Steiner [2], Christian D. Marciniak [2], Manuel Rispler [5,6], Robin Harper [1], Thomas Monz [2], Joseph Emerson [3,4], Stephen D. Bartlett [1]

Abstract

The development of prototype quantum information processors has progressed to a stage where small instances of logical qubit systems perform better than the best of their physical constituents. Advancing towards fault-tolerant quantum computing will require an understanding of the underlying error mechanisms in logical primitives as they relate to the performance of quantum error correction. In this work we demonstrate the novel capability to characterize the physical error properties relevant to fault-tolerant operations via cycle error reconstruction. We illustrate this diagnostic capability for a transversal CNOT, a prototypical component of quantum logical operations, in a 16-qubit register of a trapped-ion quantum computer. Our error characterization technique offers three key capabilities: (i) identifying context-dependent physical layer errors, enabling their mitigation; (ii) contextualizing component gates in the environment of logical operators, validating the performance differences in terms of characterized component-level physics, and (iii) providing a scalable method for predicting quantum error correction performance using pertinent error terms, differentiating correctable versus uncorrectable physical layer errors. The methods with which our results are obtained have scalable resource requirements that can be extended with moderate overhead to capture overall logical performance in increasingly large and complex systems.

Error Compensation of Single-Qubit Gates in a Surface Electrode Ion Trap Using Composite Pulses

Emily Mount [1], Chingiz Kabytayev, Stephen Crain [1], Robin Harper [3], So-Young Baek [1], Geert Vrijsen [1,3], Steven Flammia, Kenneth R. Brown, Peter Maunz [4], Jungsang Kim [1]

Abstract

The fidelity of laser-driven quantum logic operations on trapped ion qubits tend to be lower than microwave-driven logic operations due to the difficulty of stabilizing the driving fields at the ion location. Through stabilization of the driving optical fields and use of composite pulse sequences, we demonstrate high fidelity single-qubit gates for the hyperfine qubit of a $^{171}\text{Yb}^+$ ion trapped in a microfabricated surface electrode ion trap. Gate error is characterized using a randomized benchmarking protocol, and an average error per randomized Clifford group gate of $3.6(3)\times10^{-4}$ is measured. We also report experimental realization of palindromic pulse sequences that scale efficiently in sequence length.