J. M. Pomeroy

Fe XVII X-ray Line Ratios for Accurate Astrophysical Plasma Diagnostics

J. D. Gillaspy [1], T. Lin [2], L. Tedesco [1], J. N. Tan [1], J. M. Pomeroy [1], J. M. Laming [3], N. Brickhouse [2], G. -X. Chen [2], E. Silver [2]

Abstract

New laboratory measurements using an Electron Beam Ion Trap (EBIT) and an x-ray microcalorimeter are presented for the n=3 to n=2 Fe XVII emission lines in the 15 Å to 17 Å range, along with new theoretical predictions for a variety of electron energy distributions. This work improves upon our earlier work on these lines by providing measurements at more electron impact energies (seven values from 846 to 1185 eV), performing an in situ determination of the x-ray window transmission, taking steps to minimize the ion impurity concentrations, correcting the electron energies for space charge shifts, and estimating the residual electron energy uncertainties. The results for the 3C/3D and 3s/3C line ratios are generally in agreement with the closest theory to within 10%, and in agreement with previous measurements from an independent group to within 20%. Better consistency between the two experimental groups is obtained at the lowest electron energies by using theory to interpolate, taking into account the significantly different electron energy distributions. Evidence for resonance collision effects in the spectra is discussed. Renormalized values for the absolute cross sections of the 3C and 3D lines are obtained by combining previously published results, and shown to be in agreement with the predictions of converged R-matrix theory. This work establishes consistency between results from independent laboratories and improves the reliability of these lines for astrophysical diagnostics. Factors that should be taken into account for accurate diagnostics are discussed, including electron energy distribution, polarization, absorption/scattering, and line blends.

EUV spectra of highly-charged ions W$^{54+}$-W$^{63+}$ relevant to ITER diagnostics

Yu. Ralchenko, I. N. Draganic, J. N. Tan, J. D. Gillaspy, J. M. Pomeroy, J. Reader, U. Feldman, G. E. Holland

Abstract

We report the first measurements and detailed analysis of extreme ultraviolet (EUV) spectra (4 nm to 20 nm) of highly-charged tungsten ions W$^{54+}$ to W$^{63+}$ obtained with an electron beam ion trap (EBIT). Collisional-radiative modelling is used to identify strong electric-dipole and magnetic-dipole transitions in all ionization stages. These lines can be used for impurity transport studies and temperature diagnostics in fusion reactors, such as ITER. Identifications of prominent lines from several W ions were confirmed by measurement of isoelectronic EUV spectra of Hf, Ta, and Au. We also discuss the importance of charge exchange recombination for correct description of ionization balance in the EBIT plasma.

Spectra of W$^{39+}$-W$^{47+}$ in the 12 nm to 20 nm region observed with an EBIT light source

Yu. Ralchenko, J. Reader, J. M. Pomeroy, J. N. Tan, J. D. Gillaspy

Abstract

We observed spectra of highly ionized tungsten in the extreme ultraviolet with an electron beam ion trap (EBIT) and a grazing incidence spectrometer at the National Institute of Standards and Technology. Stages of ionization were distinguished by varying the energy of the electron beam between 2.1 keV and 4.3 keV and correlating the energies with spectral line emergence. The spectra were calibrated by reference lines of highly ionized iron produced in the EBIT. Identification of the observed lines was aided by collisional-radiative modeling of the EBIT plasma. Good quantitative agreement was obtained between the modeling results and the experimental observations. Our line identifications complement recent results for W$^{40+}$-W$^{45+}$ observed in a tokamak plasma by Pütterich {\it et al} (\jpb {\bf 38}, 3071, 2005). For most lines we agree with their assignment of ionization stage. Additionally, we present new identifications for some allowed and forbidden lines of W$^{39+}$, W$^{44+}$, W$^{46+}$, and W$^{47+}$. The uncertainties of our wavelengths range from 0.002 nm to 0.010 nm.