John King Gamble

Demonstration of qubit operations below a rigorous fault tolerance threshold with gate set tomography

Robin Blume-Kohout [1], John King Gamble [1], Erik Nielsen [2], Kenneth Rudinger [1], Jonathan Mizrahi [2], Kevin Fortier [2], Peter Maunz [2]

Abstract

Quantum information processors promise fast algorithms for problems inaccessible to classical computers. But since qubits are noisy and error-prone, they will depend on fault-tolerant quantum error correction (FTQEC) to compute reliably. Quantum error correction can protect against general noise if -- and only if -- the error in each physical qubit operation is smaller than a certain threshold. The threshold for general errors is quantified by their diamond norm. Until now, qubits have been assessed primarily by randomized benchmarking, which reports a different "error rate" that is not sensitive to all errors, and cannot be compared directly to diamond norm thresholds. Here we use gate set tomography (GST) to completely characterize operations on a trapped-Yb$^+$-ion qubit and demonstrate with very high ($>95\%$) confidence that they satisfy a rigorous threshold for FTQEC (diamond norm $\leq6.7\times10^{-4}$).

Robust, self-consistent, closed-form tomography of quantum logic gates on a trapped ion qubit

Robin Blume-Kohout [1], John King Gamble [1], Erik Nielsen [1], Jonathan Mizrahi [1], Jonathan D. Sterk [1], Peter Maunz [1]

Abstract

We introduce and demonstrate experimentally: (1) a framework called "gate set tomography" (GST) for self-consistently characterizing an entire set of quantum logic gates on a black-box quantum device; (2) an explicit closed-form protocol for linear-inversion gate set tomography (LGST), whose reliability is independent of pathologies such as local maxima of the likelihood; and (3) a simple protocol for objectively scoring the accuracy of a tomographic estimate without reference to target gates, based on how well it predicts a set of testing experiments. We use gate set tomography to characterize a set of Clifford-generating gates on a single trapped-ion qubit, and compare the performance of (i) standard process tomography; (ii) linear gate set tomography; and (iii) maximum likelihood gate set tomography.